The TanDEM-X Digital Elevation Model and Terrestrial Impact Structures

We utilized the TanDEM-X digital elevation model (DEM) for investigating complete record of confirmed terrestrial impact structures with respect to its suitability support geological analysis. The consistently high resolution and accuracy this is a prerequisite detailed morphological studies. This DEM represents an interesting repository aid in preparing executing fieldwork exploration new crater candidates. For selection small, mid-sized, large structures, we here compare results those from other DEMs that were derived either synthetic aperture radar interferometry or optical stereo pairs. Our analysis includes high-resolution mapping generation cross sections. Only very small craters, when diameter order pixel posting 12 m texture local environment does not remote sensing, accurate hampered. demonstrate horizontal vertical accuracies DEM, coupled dense grid, provide considerable improvement space-borne sensing simple complex over wide range diameters.